BCDC_RISKV/atpg.log
2026-05-29 10:19:13 +02:00

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20 KiB
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charapallivenkatsaja@efiapps0:/users/projekte/projekt01/RISC-V_w_RAM-Macros_single_clock$ tessent -shell
// Tessent Shell 2023.4-p1 Mon Feb 19 16:22:02 GMT 2024
// Unpublished work. Copyright 2024 Siemens
//
// This material contains trade secrets or otherwise confidential
// information owned by Siemens Industry Software Inc. or its affiliates
// (collectively, "SISW"), or its licensors. Access to and use of this
// information is strictly limited as set forth in the Customer's
// applicable agreements with SISW.
//
// Siemens software executing under x86-64 Linux on Thu May 28 17:29:18 CEST 2026.
// 64 bit version
// Host: efiapps0.ads1.fh-nuernberg.de (12 x 3.5 GHz, 48014 MB RAM, 24575 MB Swap)
//
SETUP> source scri
scripts scripts_risc_v
SETUP> source scripts_risc_v/5_atpg.do
// sub-command: set_context patterns -scan
// sub-command: set_tsdb_output_directory /users/projekte/projekt01/RISC-V_w_RAM-Macros_single_clock/oasys.tessent.00/tsdb_outdir
// sub-command: read_cell_library /users/projekte/projekt01/RISC-V_w_RAM-Macros/libs/fastscan/NangateOpenCellLibrary_45nm_SVT_slow_0p85V_conditional_nldm.fslib
// Reading DFT Library file /users/projekte/projekt01/RISC-V_w_RAM-Macros/libs/fastscan/NangateOpenCellLibrary_45nm_SVT_slow_0p85V_conditional_nldm.fslib
// Finished reading file /users/projekte/projekt01/RISC-V_w_RAM-Macros/libs/fastscan/NangateOpenCellLibrary_45nm_SVT_slow_0p85V_conditional_nldm.fslib
// sub-command: read_cell_library /users/projekte/projekt01/RISC-V_w_RAM-Macros/libs/fastscan/NangateOpenCellLibrary_worst_low_ccs_0.85v.fslib
// Reading DFT Library file /users/projekte/projekt01/RISC-V_w_RAM-Macros/libs/fastscan/NangateOpenCellLibrary_worst_low_ccs_0.85v.fslib
// Finished reading file /users/projekte/projekt01/RISC-V_w_RAM-Macros/libs/fastscan/NangateOpenCellLibrary_worst_low_ccs_0.85v.fslib
// sub-command: read_cell_library /users/projekte/projekt01/RISC-V_w_RAM-Macros/libs/fastscan/LowPowerOpenCellLibrary_worst_low_ccs.fslib
// Reading DFT Library file /users/projekte/projekt01/RISC-V_w_RAM-Macros/libs/fastscan/LowPowerOpenCellLibrary_worst_low_ccs.fslib
// Finished reading file /users/projekte/projekt01/RISC-V_w_RAM-Macros/libs/fastscan/LowPowerOpenCellLibrary_worst_low_ccs.fslib
// sub-command: read_cell_library /users/projekte/projekt01/RISC-V_w_RAM-Macros/libs/fastscan/LowPowerOpenCellLibrary_worst_low_ccs_0.85v.fslib
// Reading DFT Library file /users/projekte/projekt01/RISC-V_w_RAM-Macros/libs/fastscan/LowPowerOpenCellLibrary_worst_low_ccs_0.85v.fslib
// Finished reading file /users/projekte/projekt01/RISC-V_w_RAM-Macros/libs/fastscan/LowPowerOpenCellLibrary_worst_low_ccs_0.85v.fslib
// sub-command: read_cell_library /users/projekte/projekt01/RISC-V_w_RAM-Macros/libs/fastscan/NangateOpenCellLibrary_45nm_HVT_worst_low_0p85V_conditional_nldm.fslib
// Reading DFT Library file /users/projekte/projekt01/RISC-V_w_RAM-Macros/libs/fastscan/NangateOpenCellLibrary_45nm_HVT_worst_low_0p85V_conditional_nldm.fslib
// Finished reading file /users/projekte/projekt01/RISC-V_w_RAM-Macros/libs/fastscan/NangateOpenCellLibrary_45nm_HVT_worst_low_0p85V_conditional_nldm.fslib
// sub-command: read_cell_library /users/projekte/projekt01/RISC-V_w_RAM-Macros/libs/fastscan/NangateOpenCellLibrary_45nm_LVT_worst_low_conditional_nldm.fslib
// Reading DFT Library file /users/projekte/projekt01/RISC-V_w_RAM-Macros/libs/fastscan/NangateOpenCellLibrary_45nm_LVT_worst_low_conditional_nldm.fslib
// Finished reading file /users/projekte/projekt01/RISC-V_w_RAM-Macros/libs/fastscan/NangateOpenCellLibrary_45nm_LVT_worst_low_conditional_nldm.fslib
// sub-command: read_cell_library /users/projekte/projekt01/RISC-V_w_RAM-Macros/libs/fastscan/PLL.fslib
// Reading DFT Library file /users/projekte/projekt01/RISC-V_w_RAM-Macros/libs/fastscan/PLL.fslib
// Finished reading file /users/projekte/projekt01/RISC-V_w_RAM-Macros/libs/fastscan/PLL.fslib
// sub-command: read_cell_library /users/projekte/projekt01/RISC-V_w_RAM-Macros/libs/fastscan/IO.fslib
// Reading DFT Library file /users/projekte/projekt01/RISC-V_w_RAM-Macros/libs/fastscan/IO.fslib
// Finished reading file /users/projekte/projekt01/RISC-V_w_RAM-Macros/libs/fastscan/IO.fslib
// sub-command: read_design cpu -design_id Scan_0
// sub-command: add_black_boxes -modules " MemGen_16_10 "
// Command 'add_black_boxes' requires an elaborated design. Automatically elaborating the design ...
// Note: 36 duplicate cell library models were read. The last model read of the same name was kept.
// To see detailed messages per duplicate model, issue 'set_cell_library_options -report_duplicate_models on'
// before issuing 'read_cell_library'.
// Warning: 1 cell library model contained 2 floating model outputs.
// To see detailed messages per model, issue 'set_cell_library_options -report_floating_nets on'
// before issuing 'read_cell_library'.
// Note: Changing pin 'CK' function from 'active_low_clock' to 'clock_in'
// Model 'CLKGATE_X1_SVT' line 812 file '/users/projekte/projekt01/RISC-V_w_RAM-Macros/libs/fastscan/NangateOpenCellLibrary_45nm_SVT_slow_0p85V_conditional_nldm.fslib'
// Note: Changing pin 'CK' function from 'active_low_clock' to 'clock_in'
// Model 'CLKGATE_X2_SVT' line 843 file '/users/projekte/projekt01/RISC-V_w_RAM-Macros/libs/fastscan/NangateOpenCellLibrary_45nm_SVT_slow_0p85V_conditional_nldm.fslib'
// Note: Changing pin 'CK' function from 'active_low_clock' to 'clock_in'
// Model 'CLKGATE_X4_SVT' line 874 file '/users/projekte/projekt01/RISC-V_w_RAM-Macros/libs/fastscan/NangateOpenCellLibrary_45nm_SVT_slow_0p85V_conditional_nldm.fslib'
// Note: Changing pin 'CK' function from 'active_low_clock' to 'clock_in'
// Model 'CLKGATE_X8_SVT' line 905 file '/users/projekte/projekt01/RISC-V_w_RAM-Macros/libs/fastscan/NangateOpenCellLibrary_45nm_SVT_slow_0p85V_conditional_nldm.fslib'
// Note: Changing pin 'CK' function from 'active_low_clock' to 'clock_in'
// Model 'CLKGATE_X1' line 812 file '/users/projekte/projekt01/RISC-V_w_RAM-Macros/libs/fastscan/NangateOpenCellLibrary_worst_low_ccs_0.85v.fslib'
// Note: Changing pin 'CK' function from 'active_low_clock' to 'clock_in'
// Model 'CLKGATE_X2' line 843 file '/users/projekte/projekt01/RISC-V_w_RAM-Macros/libs/fastscan/NangateOpenCellLibrary_worst_low_ccs_0.85v.fslib'
// Note: Changing pin 'CK' function from 'active_low_clock' to 'clock_in'
// Model 'CLKGATE_X4' line 874 file '/users/projekte/projekt01/RISC-V_w_RAM-Macros/libs/fastscan/NangateOpenCellLibrary_worst_low_ccs_0.85v.fslib'
// Note: Changing pin 'CK' function from 'active_low_clock' to 'clock_in'
// Model 'CLKGATE_X8' line 905 file '/users/projekte/projekt01/RISC-V_w_RAM-Macros/libs/fastscan/NangateOpenCellLibrary_worst_low_ccs_0.85v.fslib'
// Note: Changing pin 'CK' function from 'active_low_clock' to 'clock_in'
// Model 'CLKGATE_X1_HVT' line 812 file '/users/projekte/projekt01/RISC-V_w_RAM-Macros/libs/fastscan/NangateOpenCellLibrary_45nm_HVT_worst_low_0p85V_conditional_nldm.fslib'
// Note: Changing pin 'CK' function from 'active_low_clock' to 'clock_in'
// Model 'CLKGATE_X2_HVT' line 843 file '/users/projekte/projekt01/RISC-V_w_RAM-Macros/libs/fastscan/NangateOpenCellLibrary_45nm_HVT_worst_low_0p85V_conditional_nldm.fslib'
// Note: Changing pin 'CK' function from 'active_low_clock' to 'clock_in'
// Model 'CLKGATE_X4_HVT' line 874 file '/users/projekte/projekt01/RISC-V_w_RAM-Macros/libs/fastscan/NangateOpenCellLibrary_45nm_HVT_worst_low_0p85V_conditional_nldm.fslib'
// Note: Changing pin 'CK' function from 'active_low_clock' to 'clock_in'
// Model 'CLKGATE_X8_HVT' line 905 file '/users/projekte/projekt01/RISC-V_w_RAM-Macros/libs/fastscan/NangateOpenCellLibrary_45nm_HVT_worst_low_0p85V_conditional_nldm.fslib'
// Note: Changing pin 'CK' function from 'active_low_clock' to 'clock_in'
// Model 'CLKGATE_X1_LVT' line 812 file '/users/projekte/projekt01/RISC-V_w_RAM-Macros/libs/fastscan/NangateOpenCellLibrary_45nm_LVT_worst_low_conditional_nldm.fslib'
// Note: Changing pin 'CK' function from 'active_low_clock' to 'clock_in'
// Model 'CLKGATE_X2_LVT' line 843 file '/users/projekte/projekt01/RISC-V_w_RAM-Macros/libs/fastscan/NangateOpenCellLibrary_45nm_LVT_worst_low_conditional_nldm.fslib'
// Note: Changing pin 'CK' function from 'active_low_clock' to 'clock_in'
// Model 'CLKGATE_X4_LVT' line 874 file '/users/projekte/projekt01/RISC-V_w_RAM-Macros/libs/fastscan/NangateOpenCellLibrary_45nm_LVT_worst_low_conditional_nldm.fslib'
// Note: Changing pin 'CK' function from 'active_low_clock' to 'clock_in'
// Model 'CLKGATE_X8_LVT' line 905 file '/users/projekte/projekt01/RISC-V_w_RAM-Macros/libs/fastscan/NangateOpenCellLibrary_45nm_LVT_worst_low_conditional_nldm.fslib'
// Note: Top design is 'cpu'.
// Warning: 32 cases: Unused net in DFT library model
// Warning: 106 cases: Undriven net in netlist module
// Warning: 1 case: Floating input on instance in netlist
// Warning: 47 cases: Net in netlist not connected
// Note: Issue set_current_design with the -show_elaboration_warnings option to see more details about previous warnings
// Design elaboration successful.
// sub-command: add_black_boxes -modules " MemGen_32_11 "
// sub-command: add_black_boxes -modules " main_mem "
// sub-command: set_current_design cpu
// Warning: Undefined modules were found.
// Before using "set_system_mode" or "create_flat_model", you must either define
// the missing modules using "read_verilog" and/or "read_cell_library", or use the
// following command to treat them as black boxes:
add_black_boxes -modules { \
MemGen_16_10 \
}
// You can also use "add_black_boxes -auto" to black box all undefined modules but
// it is recommended that you do not add this command to your dofile. Doing so may
// unintentionally black-box new undefined modules in future runs.
// Warning: 106 cases: Undriven net in netlist module
// Warning: 1 case: Floating input on instance in netlist
// Warning: 47 cases: Net in netlist not connected
// Note: Issue set_current_design with the -show_elaboration_warnings option to see more details about previous warnings
// Note: Design level set to 'physical_block' from previous settings
// sub-command: set_design_level physical_block
// sub-command: import_scan_mode unwrapped
// Resetting design.
// Warning: The current mode name was not specified and will be set to 'unwrapped'.
// Different ATPG configurations should use different mode names, otherwise
// they will overwrite each other in the TSDB when 'write_tsdb_data -replace' is called.
// If you will have multiple ATPG configurations for this scan mode of this design,
// use the 'set_current_mode' command to change the current mode name.
// sub-command: set_system_mode analysis
// Warning: Rule FN1 violation occurs 152 times
// Flattening process completed, cell instances=4041, gates=16395, PIs=13, POs=12, CPU time=0.08 sec.
// ---------------------------------------------------------------------------
// Begin circuit learning analyses.
// --------------------------------
// Learning completed, CPU time=0.04 sec.
// ---------------------------------------------------------------------------
// Begin scan chain identification process, memory elements = 1059.
// ---------------------------------------------------------------------------
// Begin simulation of load_unload procedure.
// Simulation of load_unload procedure completed, CPU time=0.0 sec.
// Chain = unwrapped_chain1 successfully traced with scan_cells = 256.
// Chain = unwrapped_chain2 successfully traced with scan_cells = 256.
// Chain = unwrapped_chain3 successfully traced with scan_cells = 256.
// Chain = unwrapped_chain4 successfully traced with scan_cells = 256.
// 1024 scan cells have been identified in 4 scan chains.
// Longest scan chain has 256 scan cells.
// ---------------------------------------------------------------------------
// Begin transparent latch checking for 35 latches.
// ---------------------------------------------------------------------------
// Number transparent latches = 35.
// ---------------------------------------------------------------------------
// Begin scan clock rules checking.
// ---------------------------------------------------------------------------
// 1 scan clock/set/reset lines have been identified.
// All scan clocks successfully passed off-state check.
// Capture clock is set to clk_25mhz.
// ---------------------------------------------------------------------------
// 35 non-scan memory elements are identified.
// ---------------------------------------------------------------------------
// 35 non-scan memory elements are identified as TLA. (D5)
// ---------------------------------------------------------------------------
// 64 gates may have an observable X-state. (E5)
// sub-command: report_clocks
User-defined Clock (1):
=========================
Sync and Async Source Clock
============================
----------- --------- --------
Name Off State Internal
----------- --------- --------
'clk_25mhz' 0 No
// sub-command: report_drc_rules
D5: #fails=35 handling=warning (non-scan memory element)
E5: #fails=64 handling=note (X-state propagation)
// sub-command: set_fault_type stuck
// sub-command: add_faults -all
// sub-command: create_patterns
// | ------------------------------------------------------------------------------------------------------------------ |
// | Analyzing the design |
// | |
// | Current clock restriction setting: Domain_clock (edge interaction) |
// | (optimal) |
// | |
// | Current abort limit setting: 30 |
// | Calling: set_abort_limit 300 100 |
// | ------------------------------------------------------------------------------------------------------------------ |
// | |
// | Current sequential depth: 0 (optimal) |
// | |
// | ------------------------------------------------------------------------------------------------------------------ |
// ------------------------------------------------------------------------
// Simulation performed for #gates = 16395 #faults = 4988
// system mode = analysis pattern source = internal patterns
// ------------------------------------------------------------------------
// #patterns test #faults #faults # eff. # test process RE/AU/AAB
// simulated coverage in list detected patterns patterns CPU time
// --- ------ --- --- --- --- 6.31 sec 0/27368/0
// 16 25.95% 0 2239 10 10 6.32 sec
// -----------------------------------------------------------------------
// Performing redundant fault identification for 27368 faults
// -----------------------------------------------------------------------
// deterministic ATPG invoked with abort limit = 300
// # red. # non-red. # abort # remn. progress test process
// faults faults faults faults coverage CPU time
// 20 27338 10 0 100.00% 25.96% 1903.57 sec
Statistics Report
Stuck-at Faults
---------------------------------------
Fault Classes #faults
(total)
----------------------- --------------
FU (full) 39020
--------------------- --------------
DS (det_simulation) 2239 ( 5.74%)
DI (det_implication) 7351 (18.84%)
UU (unused) 2062 ( 5.28%)
RE (redundant) 20 ( 0.05%)
AU (atpg_untestable) 27348 (70.09%)
---------------------------------------
Fault Sub-classes
---------------------
AU (atpg_untestable)
BB (black_boxes) 24599 (63.04%)
Unclassified 2749 ( 7.05%)
---------------------------------------
Coverage
---------------------
test_coverage 25.96%
fault_coverage 24.58%
atpg_effectiveness 100.00%
---------------------------------------
#test_patterns 10
#simulated_patterns 16
CPU_time (secs) 1925.7
---------------------------------------
// sub-command: report_statistics
Statistics Report
Stuck-at Faults
---------------------------------------
Fault Classes #faults
(total)
----------------------- --------------
FU (full) 39020
--------------------- --------------
DS (det_simulation) 2239 ( 5.74%)
DI (det_implication) 7351 (18.84%)
UU (unused) 2062 ( 5.28%)
RE (redundant) 20 ( 0.05%)
AU (atpg_untestable) 27348 (70.09%)
---------------------------------------
Fault Sub-classes
---------------------
AU (atpg_untestable)
BB (black_boxes) 24599 (63.04%)
Unclassified 2749 ( 7.05%)
---------------------------------------
Coverage
---------------------
test_coverage 25.96%
fault_coverage 24.58%
atpg_effectiveness 100.00%
---------------------------------------
#test_patterns 10
#simulated_patterns 16
CPU_time (secs) 1925.7
---------------------------------------
// sub-command: report_faults -summary
Statistics Report
Stuck-at Faults
---------------------------------------
Fault Classes #faults
(total)
----------------------- --------------
FU (full) 39020
--------------------- --------------
DS (det_simulation) 2239 ( 5.74%)
DI (det_implication) 7351 (18.84%)
UU (unused) 2062 ( 5.28%)
RE (redundant) 20 ( 0.05%)
AU (atpg_untestable) 27348 (70.09%)
---------------------------------------
Fault Sub-classes
---------------------
AU (atpg_untestable)
BB (black_boxes) 24599 (63.04%)
Unclassified 2749 ( 7.05%)
---------------------------------------
Coverage
---------------------
test_coverage 25.96%
fault_coverage 24.58%
atpg_effectiveness 100.00%
---------------------------------------
#test_patterns 10
#simulated_patterns 16
CPU_time (secs) 1925.7
---------------------------------------
// sub-command: write_patterns cpu_patterns.stil -stil -replace
// sub-command: write_patterns cpu_patterns_serial.v -verilog -serial -replace
// sub-command: write_tsdb_data -replace
// Writing ./oasys.tessent.00/tsdb_outdir/logic_test_cores/cpu_Scan_0.logic_test_core/cpu.atpg_mode_unwrapped/cpu_unwrapped.tcd.gz
// Writing ./oasys.tessent.00/tsdb_outdir/logic_test_cores/cpu_Scan_0.logic_test_core/cpu.atpg_mode_unwrapped/cpu_unwrapped.flat.gz
// Writing ./oasys.tessent.00/tsdb_outdir/logic_test_cores/cpu_Scan_0.logic_test_core/cpu.atpg_mode_unwrapped/cpu_unwrapped_stuck.patdb
// Writing ./oasys.tessent.00/tsdb_outdir/logic_test_cores/cpu_Scan_0.logic_test_core/cpu.atpg_mode_unwrapped/cpu_unwrapped_stuck.faults.gz
// sub-command: exit